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1

Does financial literacy affect the value of financial advice? A contingent valuation approach

Chauhan, Yogesh, Dey, Dipanjan Kumar

Journal:

Journal of Behavioral and Experimental Finance

Year:

2020

Language:

english

File:

PDF, 854 KB

english, 2020

2

Corporate governance practices, self-dealings, and firm performance: Evidence from India

Chauhan, Yogesh, Lakshmi, K. Rajya, Dey, Dipanjan Kumar

Journal:

Journal of Contemporary Accounting & Economics

Year:

2016

Language:

english

File:

PDF, 348 KB

english, 2016

3

[IEEE ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference - Graz, Austria (2015.9.14-2015.9.18)] ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC) - BSIM-CMG: Standard FinFET compact model for advanced circuit design

Duarte, Juan P., Khandelwal, Sourabh, Medury, Aditya, Hu, Chenming, Kushwaha, Pragya, Agarwal, Harshit, Dasgupta, Avirup, Chauhan, Yogesh S.

Year:

2015

Language:

english

File:

PDF, 1.51 MB

english, 2015

4

Thermal resistance modeling in FDSOI transistors with industry standard model BSIM-IMG

Kushwaha, Pragya, Bala Krishna, K., Agarwal, Harshit, Khandelwal, Sourabh, Duarte, Juan-Pablo, Hu, Chenming, Chauhan, Yogesh Singh

Journal:

Microelectronics Journal

Year:

2016

Language:

english

File:

PDF, 1.83 MB

english, 2016

5

Foreword Special Issue on Compact Modeling for Circuit Design

Iniguez, Benjamin, Grabinski, Wladek, MijalkoviC, Slobodan, Xia, Kejun, Scholten, Andries J., Chauhan, Yogesh Singh, Roy, Ananda S., Yoshitomi, Sadayuki, Xu, Kaikai

Journal:

IEEE Transactions on Electron Devices

Year:

2019

Language:

english

File:

PDF, 2.69 MB

english, 2019

6

Analytical Modeling of Surface-Potential and Intrinsic Charges in AlGaN/GaN HEMT Devices

Khandelwal, Sourabh, Chauhan, Yogesh Singh, Fjeldly, Tor A.

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 467 KB

english, 2012

7

Robust Surface-Potential-Based Compact Model for GaN HEMT IC Design

Khandelwal, Sourabh, Yadav, Chandan, Agnihotri, Shantanu, Chauhan, Yogesh Singh, Curutchet, Arnaud, Zimmer, Thomas, De Jaeger, Jean-Claude, Defrance, Nicolas, Fjeldly, Tor A.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 910 KB

english, 2013

8

Does advertising strategy matter in influencing mutual fund purchase?

Dey, Dipanjan Kumar, Chauhan, Yogesh Kumar, Chakraborti, Rajdeep

Journal:

Journal of Financial Services Marketing

Year:

2015

Language:

english

File:

PDF, 150 KB

english, 2015

9

Analysis and Modeling of Cross-Coupling and Substrate Capacitances in GaN HEMTs for Power-Electronic Applications

Aamir Ahsan, Sheikh, Ghosh, Sudip, Khandelwal, Sourabh, Chauhan, Yogesh Singh

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 5.09 MB

english, 2017

10

Six Sigma in Project Management for Software Companies

Chauhan, Yogesh, Belokar, R. M.

Journal:

SSRN Electronic Journal

Year:

2015

Language:

english

File:

PDF, 529 KB

english, 2015

11

[IEEE 2019 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) - Lausanne, Switzerland (2019.7.29-2019.7.31)] 2019 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) - NCFET-Aware Voltage Scaling

Salamin, Sami, Rapp, Martin, Amrouch, Hussam, Pahwa, Girish, Chauhan, Yogesh, Henkel, Jorg

Year:

2019

Language:

english

File:

PDF, 2.35 MB

english, 2019

12

An EKV-based high voltage MOSFET model with improved mobility and drift model

Yogesh Singh Chauhan, Renaud Gillon, Benoit Bakeroot, Francois Krummenacher, Michel Declercq, Adrian Mihai Ionescu

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 1.76 MB

english, 2007

13

[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - BSIM — Industry standard compact MOSFET models

Singh Chauhan, Yogesh, Venugopalan, Sriram, Karim, Mohammed A., Khandelwal, Sourabh, Paydavosi, Navid, Thakur, Pankaj, Niknejad, Ali M., Hu, Chenming C.

Year:

2012

Language:

english

File:

PDF, 1003 KB

english, 2012

14

BSIM—SPICE Models Enable FinFET and UTB IC Designs

Paydavosi, Navid, Venugopalan, Sriramkumar, Chauhan, Yogesh Singh, Duarte, Juan Pablo, Jandhyala, Srivatsava, Niknejad, Ali M., Hu, Chenming Calvin

Journal:

Year:

2013

Language:

english

File:

PDF, 27.59 MB

english, 2013

15

BSIM6: Analog and RF Compact Model for Bulk MOSFET

Chauhan, Yogesh Singh, Venugopalan, Sriramkumar, Chalkiadaki, Maria-Anna, Karim, Muhammed Ahosan Ul, Agarwal, Harshit, Khandelwal, Sourabh, Paydavosi, Navid, Duarte, Juan Pablo, Enz, Christian C., Nik

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.91 MB

english, 2014

16

[IEEE 2014 6th IEEE Power India International Conference (PIICON) - Delhi (2014.12.5-2014.12.7)] 2014 6th IEEE Power India International Conference (PIICON) - Performance analysis of neural network and fuzzy logic based MPPT techniques for solar PV systems

Gupta, Ankit, Kumar, Pawan, Pachauri, Rupendra Kumar, Chauhan, Yogesh K.

Year:

2014

Language:

english

File:

PDF, 383 KB

english, 2014

17

Analysis and modeling of flicker noise in lateral asymmetric channel MOSFETs

Agarwal, Harshit, Kushwaha, Pragya, Gupta, Chetan, Khandelwal, Sourabh, Hu, Chenming, Chauhan, Yogesh Singh

Journal:

Solid-State Electronics

Year:

2016

Language:

english

File:

PDF, 1.16 MB

english, 2016

18

RF Modeling of FDSOI Transistors Using Industry Standard BSIM-IMG Model

Kushwaha, Pragya, Khandelwal, Sourabh, Duarte, Juan Pablo, Hu, Chenming, Chauhan, Yogesh Singh

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2016

Language:

english

File:

PDF, 2.36 MB

english, 2016

19

Stock liquidity and stock prices crash-risk: Evidence from India

Chauhan, Yogesh, Kumar, Satish, Pathak, Rajesh

Journal:

The North American Journal of Economics and Finance

Year:

2017

Language:

english

File:

PDF, 354 KB

english, 2017

20

Compact Modeling of Cross-Sectional Scaling in Gate-All-Around FETs: 3-D to 1-D Transition

Dasgupta, Avirup, Rastogi, Priyank, Agarwal, Amit, Hu, Chenming, Chauhan, Yogesh Singh

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 2.58 MB

english, 2018

21

Do investors value the nonfinancial disclosure in emerging markets?

Chauhan, Yogesh, Kumar, Surya B.

Journal:

Emerging Markets Review

Year:

2018

Language:

english

File:

PDF, 910 KB

english, 2018

22

ASM GaN: Industry Standard Model for GaN RF and Power Devices--Part 1: DC, CV, and RF Model

Khandelwal, Sourabh, Chauhan, Yogesh Singh, Fjeldly, Tor A., Ghosh, Sudip, Pampori, Ahtisham, Mahajan, Dhawal, Dangi, Raghvendra, Ahsan, Sheikh Aamir

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 2.87 MB

english, 2018

23

[IEEE 2018 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) - Bangalore (2018.3.16-2018.3.17)] 2018 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) - A Unified Flicker Noise Model for FDSOI MOSFETs Including Back-bias Effect

Kushwaha, Pragya, Agarwal, Harshit, Dabhi, Chetan Kumar, Lin, Yen-Kai, Duarte, J-P., Hu, Chenming, Chauhan, Yogesh Singh

Year:

2018

Language:

english

File:

PDF, 608 KB

english, 2018

24

[IEEE 2019 IEEE Custom Integrated Circuits Conference (CICC) - Austin, TX, USA (2019.4.14-2019.4.17)] 2019 IEEE Custom Integrated Circuits Conference (CICC) - BSIM-BULK: Accurate Compact Model for Analog and RF Circuit Design

Gupta, Chetan, Goel, Ravi, Agarwal, Harshit, Hu, Chenming, Chauhan, Yogesh Singh

Year:

2019

Language:

english

File:

PDF, 35 KB

english, 2019

25

Compact Model for Geometry Dependent Mobility in Nanosheet FETs

Dasgupta, Avirup, Parihar, Shivendra Singh, Agarwal, Harshit, Kushwaha, Pragya, Chauhan, Yogesh Singh, Hu, Chenming

Journal:

IEEE Electron Device Letters

Year:

2020

Language:

english

File:

PDF, 405 KB

english, 2020

26

A two-step hybrid unsupervised model with attention mechanism for aspect extraction

Singh Chauhan, Ganpat, Kumar Meena, Yogesh, Gopalani, Dinesh, Nahta, Ravi

Journal:

Expert Systems with Applications

Year:

2020

File:

PDF, 882 KB

2020

27

Scalable general high voltage MOSFET model including quasi-saturation and self-heating effects

Yogesh Singh Chauhan, Costin Anghel, Francois Krummenacher, Christian Maier, Renaud Gillon, Benoit Bakeroot, Bart Desoete, Steven Frere, Andre Baguenier Desormeaux, Abhinav Sharma, Michel Declercq, Ad

Journal:

Solid-State Electronics

Year:

2006

Language:

english

File:

PDF, 2.65 MB

english, 2006

28

Modeling and Simulation Methodology for SOA-Aware Circuit Design in DC and Pulsed-Mode Operation of HV MOSFETs

Khandelwal, Sourabh, Sharma, Surya, Chauhan, Yogesh Singh, Gneiting, Thomas, Fjeldly, Tor A.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 320 KB

english, 2013

29

[IEEE ESSCIRC 2012 - 38th European Solid State Circuits Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the ESSCIRC (ESSCIRC) - BSIM — Industry standard compact MOSFET models

Chauhan, Yogesh Singh, Venugopalan, Sriram, Karim, Mohammed A., Khandelwal, Sourabh, Paydavosi, Navid, Thakur, Pankaj, Niknejad, Ali M., Hu, Chenming C.

Year:

2012

Language:

english

File:

PDF, 1.11 MB

english, 2012

30

Modeling the impact of substrate depletion in FDSOI MOSFETs

Kushwaha, Pragya, Paydavosi, Navid, Khandelwal, Sourabh, Yadav, Chandan, Agarwal, Harshit, Duarte, Juan Pablo, Hu, Chenming, Chauhan, Yogesh Singh

Journal:

Solid-State Electronics

Year:

2015

Language:

english

File:

PDF, 1.07 MB

english, 2015

31

A study, analysis and power management schemes for fuel cells

Pachauri, Rupendra Kumar, Chauhan, Yogesh K.

Journal:

Renewable and Sustainable Energy Reviews

Year:

2015

Language:

english

File:

PDF, 1.34 MB

english, 2015

32

Surface-Potential-Based Compact Modeling of Gate Current in AlGaN/GaN HEMTs

Ghosh, Sudip, Dasgupta, Avirup, Khandelwal, Sourabh, Agnihotri, Shantanu, Chauhan, Yogesh Singh

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 1.77 MB

english, 2015

33

Analytical Modeling of Flicker Noise in Halo Implanted MOSFETs

Agarwal, Harshit, Khandelwal, Sourabh, Dey, Sagnik, Hu, Chenming, Chauhan, Yogesh Singh

Journal:

IEEE Journal of the Electron Devices Society

Year:

2015

Language:

english

File:

PDF, 492 KB

english, 2015

34

[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - BSIM-IMG: Compact model for RF-SOI MOSFETs

Kushwaha, Pragya, Agarwal, Harshit, Khandelwal, Sourabh, Duarte, Juan-Pablo, Medury, Aditya, Hu, Chenming, Chauhan, Yogesh S.

Year:

2015

Language:

english

File:

PDF, 970 KB

english, 2015

35

Unified Compact Model Covering Drift-Diffusion to Ballistic Carrier Transport

Khandelwal, Sourabh, Agarwal, Harshit, Kushwaha, Pragya, Duarte, Juan Pablo, Medury, Aditya, Chauhan, Yogesh S., Salahuddin, Sayeef, Hu, Chenming

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 930 KB

english, 2016

36

Analytical Modeling and Experimental Validation of Threshold Voltage in BSIM6 MOSFET Model

Agarwal, Harshit, Gupta, Chetan, Kushwaha, Pragya, Yadav, Chandan, Duarte, Juan P., Khandelwal, Sourabh, Hu, Chenming, Chauhan, Yogesh S.

Journal:

IEEE Journal of the Electron Devices Society

Year:

2015

Language:

english

File:

PDF, 668 KB

english, 2015

37

Modeling of Induced Gate Thermal Noise in HEMTs

Dasgupta, Avirup, Chauhan, Yogesh Singh

Journal:

IEEE Microwave and Wireless Components Letters

Year:

2016

Language:

english

File:

PDF, 441 KB

english, 2016

38

[IEEE 2014 Annual IEEE India Conference (INDICON) - Pune, India (2014.12.11-2014.12.13)] 2014 Annual IEEE India Conference (INDICON) - BSIM-IMG with improved surface potential calculation recipe

Kushwaha, Pragya, Yadav, Chandan, Agarwal, Harshit, Chauhan, Yogesh Singh, Srivatsava, Jandhyala, Khandelwal, Sourabh, Duarte, Juan Pablo, Hu, Chenming

Year:

2014

Language:

english

File:

PDF, 1.15 MB

english, 2014

39

A comparative investigation of maximum power point tracking methods for solar PV system

Gupta, Ankit, Chauhan, Yogesh K., Pachauri, Rupendra Kumar

Journal:

Year:

2016

Language:

english

File:

PDF, 1.25 MB

english, 2016

40

Transition metal ferrocenyl dithiocarbamates functionalized dye-sensitized solar cells with hydroxy as an anchoring group

Yadav, Reena, Waghadkar, Yogesh, Kociok-Köhn, Gabriele, Kumar, Abhinav, Rane, Sunit B., Chauhan, Ratna

Journal:

Optical Materials

Year:

2016

Language:

english

File:

PDF, 1.29 MB

english, 2016

41

[IEEE 2016 International Conference on Electrical, Electronics, and Optimization Techniques (ICEEOT) - Chennai, India (2016.3.3-2016.3.5)] 2016 International Conference on Electrical, Electronics, and Optimization Techniques (ICEEOT) - Generation of PWM using verilog In FPGA

Srivastava, Rohan, Chauhan, Yogesh K., Kumar, Bhavnesh

Year:

2016

Language:

english

File:

PDF, 415 KB

english, 2016

42

Effective Doping of Monolayer Phosphorene by Surface Adsorption of Atoms for Electronic and Spintronic Applications

Rastogi, Priyank, Kumar, Sanjay, Bhowmick, Somnath, Agarwal, Amit, Chauhan, Yogesh Singh

Journal:

IETE Journal of Research

Year:

2017

Language:

english

File:

PDF, 1.85 MB

english, 2017

43

[IEEE 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2016.8.3-2016.8.5)] 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Modeling of kink-effect in RF behaviour of GaN HEMTs using ASM-HEMT model

Ahsan, Sheikh Aamir, Ghosh, Sudip, Khandelwal, Sourabh, Chauhan, Yogesh Singh

Year:

2016

Language:

english

File:

PDF, 1.59 MB

english, 2016

44

[IEEE 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2016.8.3-2016.8.5)] 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Modeling of high voltage LDMOSFET using industry standard BSIM6 MOS model

Gupta, Chetan, Agarwal, Harshit, Chauhan, Yogesh S., Khandelwal, Sourabh, Lin, Yen-Kai, Hu, Chenming, Gillon, Renaud

Year:

2016

Language:

english

File:

PDF, 536 KB

english, 2016

45

[IEEE 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2016.8.3-2016.8.5)] 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Modeling of GeOI and validation with Ge-CMOS inverter circuit using BSIM-IMG industry standard model

Agarwal, Harshit, Kushwaha, Pragya, Chauhan, Yogesh S., Khandelwal, Sourabh, Duarte, Juan P., Lin, Yen-Kai, Chang, Huan-Lin, Hu, Chenming, Wu, Heng, Ye, Peide D.

Year:

2016

Language:

english

File:

PDF, 1.49 MB

english, 2016

46

[IEEE 2016 IEEE 1st International Conference on Power Electronics, Intelligent Control and Energy Systems (ICPEICES) - Delhi, India (2016.7.4-2016.7.6)] 2016 IEEE 1st International Conference on Power Electronics, Intelligent Control and Energy Systems (ICPEICES) - Comparison of Perturb & Observe and Ripple correlation control MPPT algorithms for PV array

Trivedi, Akankshi, Gupta, Ankit, Pachauri, Rupendra Kumar, Chauhan, Yogesh K.

Year:

2016

Language:

english

File:

PDF, 1.66 MB

english, 2016

47

Analysis and modeling of zero-threshold voltage native devices with industry standard BSIM6 model

Gupta, Chetan, Agarwal, Harshit, Lin, Y. K., Ito, Akira, Hu, Chenming, Chauhan, Yogesh Singh

Journal:

Japanese Journal of Applied Physics

Year:

2017

Language:

english

File:

PDF, 3.13 MB

english, 2017

48

Compact Modeling of Drain Current Thermal Noise in FDSOI MOSFETs Including Back-Bias Effect

Sahu, Yogendra, Kushwaha, Pragya, Dasgupta, Avirup, Hu, Chenming, Chauhan, Yogesh Singh

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2017

Language:

english

File:

PDF, 2.96 MB

english, 2017

49

Evidence of Algorithmic Trading from Indian Equity Market: Interpreting the Transaction Velocity Element of Financialization

Dubey, Ritesh Kumar, Chauhan, Yogesh Kumar, Syamala, Sudhakara Reddy

Journal:

Research in International Business and Finance

Year:

2017

Language:

english

File:

PDF, 378 KB

english, 2017

50

Performance Evaluation of 7 nm Node Negative Capacitance FinFET based SRAM

Dutta, Tapas, Pahwa, Girish, Trivedi, Amit Ranjan, Sinha, Saurabh, Agarwal, Amit, Chauhan, Yogesh Singh

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 2.79 MB

english, 2017